AWG7000 Series Arbitrary/Function Generators
The AWG7000 Series is designed to address the needs of design and test engineers who are dealing with rapidly increasing serial data rates and the advance of digital RF technologies.
With a sample rate of up to 20GS/s and a vertical resolution of 10Bit, no other AWG on the market can come close to generating the level of frequencies, bandwidth and signal fidelity of the AWG7000 Series. When you need to generate the fastest, real-world waveforms for testing or simulation, complete with controllable jitter, noise, and other anomalies, the Tektronix AWG7000 Series Arbitrary Waveform Generator is your best choice to shorten design times and stay ahead of the technology curve.
Application Examples
The AWG7000 was named EDN "Innovation of the Year" award finalist and ideal for a wide range of applications.
The need for performance arbitrary waveform generation is broad and spans over a wide array of applications. With the AWG7000 Series, Tektronix’ 3rd generation of industry leading Arbitrary Waveform Generators represent a new benchmark in performance, sample rate, signal fidelity, and timing resolution. The ability to create, generate, or replicate either ideal, distorted, or “real-life” signals is essential in the design and testing process. Signal generation with controllable rise- and fall times, noise or jitter; pre-emphasis, multilevel and mixed signals; wideband RF, and fast changing signals are just some of the capabilities of the AWG7000 Series.
Pre/De-Emphasized Signal Generation
 With increasing transmission speeds and to compensate for frequency characteristics of “lossy” media, the technique of pre/de-emphasis is increasingly applied. Serial data standards such as PCI Express and others have also included pre/de-emphasis tests as a requirement to meet the respective compliance test specification. The AWG7000 Series, with its performance and analog output, enables users to directly generate pre/de-emphasized signals for next generation serial data standards. It also enables users to generate 3-level signals as required for SATA Out-of-Band (OOB) testing. The direct generation of such signals provides an increased signal quality and avoids cumbersome signal generation via multiple channels and power combiner.
The screenshot above left is a Pre/De-emphasized signal.
Multilevel Signal Generation
 The requirements for serial interfaces are continuously increasing. Higher and higher data rates are required, and the performance of cables and circuits is moving closer to their theoretical limits. One technique to increase the data rate without increasing the transition-rate is by applying multilevel signals, wherein a signal can assume more than the standard binary 2 levels. In multi-level signaling one can think of multi-level discrete amplitudes of a signal. This phenomenon is known as pulse-amplitude-modulation or PAM. A 4PAM signal, a signal with 4 different amplitudes, increases the data rate by four without increasing the transition rate of the signal. Multilevel signals are not only applied for data transmission. Multi-level memory chips, storing more than a single bit in an individual memory element, are being produced and multi-level coding of data for storage on optical disks is being considered as an efficient way to increase storage capacity.
The screenshot above right is a 20 Gb/s 4PAM signal (5 GS/s; AWG7101).
Signal Generation for Storage Device Testing
 Increasing capacity requirements for storage devices leads to the development of new and faster read- and-write strategies for magnetic as well as optical storage devices. Multi-level coding of data for storage on optical disks is also being considered as an efficient way to increase storage capacity. The AWG7000 Series with its ability to generate an accurate reproduction of the readandwrite signals, enables users to design, develop and test the latest storage devices. With sample rates up to 20 GS/s, and the generation of up to 6 signals (2 analog plus 4 Marker) with a clock timing resolution of 100 ps, the AWG7000 Series represents a new benchmark in the industry.
The figure above left is a hard disk read channel signal (5 Gb/s 2 points per cell); AWG7101 with 10 GS/s.
Wideband RF-Signal Generation
 In the RF world, technologies ranging from a wireless mouse to a satellite image require test equipment that can provide enough sample rate and resolution to re-create even the most complex RF behavior. The latest digital RF technologies often exceed the capabilities of current test equipment to generate wide bandwidth and fast changing signals that are increasingly seen in many wireless applications such as radar, UWB, and others. The AWG7000 Series enables the direct generation of RF signals and their output via the D/A converter for signals up to a carrier frequency of 5 GHz and a Bandwidth of 5.8 GHz. The direct generation of IF or RF signals avoids I/Q degradations and lengthy adjustments associated with traditional generation using I/Q modulators. The AWG7000 Series with its maximum sample rate of 20 GS/s is the sole solution that allows a direct RF signal generation for up to 5 GHz.
The screenshot above right is UWB (MBOA) three band (480 Mb/s 1795 MAC bytes 96 symbol payload); 3.168 GHz-4.752 GHz; AWG7102; Interleave at 15.84 GS/s; 0.5 Vp-p
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