Jitter and Timing Analysis
Tektronix provides flexible, yet accurate jitter and noise analysis on it's oscilloscopes that precisely define Tj @ BER and break down Tj into it's components (Rj, Dj, DDj, Pj, ISI, Sj) for greater insight. Using either the Dual-Dirac model required by PCI-SIG or the spectral approach endorsed by the T11 MJSQ, Tektronix jitter analysis tools validate performance of today's digital standards. Tektronix DSA70000B and DSA8200 Oscilloscopes feature flexible, easy to use jitter analysis toolsets containing setups like Jitter Wizard and reporting capabilities like 3-D Contour Eye diagrams which allow you to efficiently identify and resolve jitter issues in your design.
Application notes include,
Jitter Fact Sheet
Regardless whether you need a quick clock jitter measurement, or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.
Understanding and Characterising Timing Jitter Primer
Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.
Real-Time Spectrum Analyser Performs Jitter Measurements Tutorial
In this presentation, we will begin with a basic overview of jitter. Proceed with a discussion on what are some of the important measurement challenges to consider when analysing jitter. Then conclude by highlighting some of the key Real-Time Spectrum Analyser capabilities that solve these challenges.
Characterising Phase Locked Loops Using Tektronix Real-Time Spectrum Analysers (RTSA)
This application note presents an overview of Phase Locked Loop operation including both linear and non-linear effects. It also shows measurements of these effects in both the time and frequency domains using Tektronix Real-Time Spectrum Analysers.
Choose the Right Platform for Your Jitter Measurements
This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter.
Equalisation and Serial Data Link Analysis Methods (SDLA) with 80SJNB Advanced
This application note describes test and measurement methodology used by serial data standards running on lossy/dispersive channels which close the eye diagram at the receiver, and where equalization (FFE/DFE) is used to open the eye. Comparison of measurement at the receiver and the recommended measurement at the Transmitter is demonstrated, as well as other SDLA concepts of interest to serial data designers and test engineers.
|Tektronix||AWG7000C Performance Arbitrary Waveform Generators||Signal Generators|
|Tektronix||DSA8300 Digital Sampling Oscilloscope||Oscilloscopes|