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oscilloscopes IMEX Oscilloscopes  

7000 Series Oscilloscopes

The TDS7000/B Series' unique combination of superior measurement fidelity, unrivaled analysis, and uncompromised usability makes it the ultimate test machine to simplify and speed the design of high-speed, complex systems. This family offers the industry’s best solution to the challenging signal integrity issues faced by designers verifying, characterizing and debugging sophisticated electronic designs. They deliver up to 7 GHz true analog bandwidth, down to 43 ps rise time and 20 GS/s maximum real-time sample rate to capture critical events with fine detail.

The new TDS7704B digital phosphor oscilloscope combines the world's fastest acquisition system and highest resolution XGA screen display with unrivaled analysis and compliance to the widest range of standards to simplify and speed the design of high-speed, complex systems at the extreme edge.

Features at a Glance

• Up to 7.25 GHz True Analog Bandwidth and Down to 43 ps Risetime (20% - 80%)
• > 400,000 wfms/s Waveform Capture Rate, powered by exclusive DPX® acquisition technology
• 20 GS/s Maximum Real-time Sample Rate
• Exceptional Delta-time Accuracy for High-confidence in Critical Timing Measurements
• Powerful Triggering Features for Fast Detection of Relevant Faults
• Communications Mask Testing Up to 4.25 Gb/s Rates
• Clock Recovery from Serial Data Streams up to 3.125 Gb/s
• Up to 64 MB Record Length with MultiView Zoom™ for Quick Navigation of Long Records
• TekConnect® Interface for High Fidelity Connection
• Classic Direct Controls, Touch-sensitive Display, or Mouse Navigation
• OpenChoice® with Windows 2000 Delivers Built-in Networking and Analysis
• XGA 1024x768 display

Applications

• Signal Integrity, Jitter and Timing Analysis
• Verification, Debug and Characterization of Sophisticated Designs
• Design Development and Compliance Testing of Serial Data Streams Up to 4.25 Gb/s Rates
• Debug of Telecom, Datacom and Storage Area Network Equipment Designs and High-speed Backplanes
• Spectral Analysis
• Investigation of Transient Phenomena

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