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8000 Series Oscilloscopes
Features at a Glance• DC to 70+ GHz*1 Bandwidth *1 Bandwidth is determined by plug-in modules and may exceed 70 GHz as
higher speed modules will become available in the future. Applications• High speed Component Test State-of-the-art Acquisition SystemThe TDS8200 Digital Sampling Oscilloscope is a comprehensive acquisition and measurement instrument capable of processing very fast signals. It is the prime tool for research, design evaluation, and manufacturing test in fields of semiconductor test, components test, TDR, and other applications requiring bandwidths into tens of GHz. The TDS8200 acquires data with very low jitter and at a very fast acquisition rate. It can acquire the data in several time windows, each with its own acquisition parameters and display window. It provides a comprehensive suite of measurement capabilities to evaluate the data, as well as acquisition math and waveform math functionality to process the results farther, with histograms, mask testing and statistics. Acquired data can be stored in waveform (vector) format, traditionally used for waveforms, and in an 3D database format common for eye diagrams storage. The TDS8200 provides great flexibility of data storage in database format with four 3D databases available simultaneously; the databases offer an industry-first variable data persistence with accurate data ageing. Colour-grading of waveform data adds a third dimension, sample density, to your signal acquisitions and analyses; several mappings of sample density–to-colour are available. Modularity and FlexibilityBuilding on the success of the TDS/CSA8000B, with which it is compatible, the TDS8200 supports a large and growing family of electrical and optical plug-in modules. This family includes the first 8200 module for the 8200 series, the 82A04, as well as the 8000 series modules, which work in both the new TDS/CSA8200 mainframe as well as in the older TDS/CSA8000 and TDS/CSA8000B mainframe. This modular architecture lets you configure the instrument with the right features for a very wide range of existing standards and applications, and with new modules for the future needs. With its differential clock recovery module the instrument can be used for acquisition of differential electrical signals even when there is no trigger available, just like a traditional Real Time Oscilloscope. The available electrical modules include a variety of modules with bandwidths up to 70 GHz and specialized features such as Time Domain Reflectometry (TDR). For the TDR probing, the P8018 probe supports full TDR bandwidth, while the 80A02 module provides protection from the damage by electrostatic discharge. These features enable even measurements performed in manufacturing environment to achieve highly precise results, while protecting the TDR module itself. The probing solutions for the electrical signals include adaptor for the popular TekConnect probing system, bringing the performance of Tektronix’ state-of-the-art probes (high impedance, differential, etc.) to the TDS8200 family. An electrical clock recovery module covering most popular rates between 50Mb/s and 12.6Gb/s is available; the ranges are broad enough to cover even future needs. Optical modules provide complete optical test solutions for both telecom (155 Mb/s to 43 Gb/s) and Datacom (Fibre Channel, InfiniBand and Gigabit Ethernet) applications, with clock recovery available as an option for most optical modules; a variable clock recovery is available for most popular ranges. Signal acquisition at high frequency ranges above 2.0 Gb/s will benefit from the ultra-low jitter brought to the TDS8200 by the 80A04 Phase Reference module. Using a customer supplied clock synchronous to the signal under the test, this module can either de-jitter traditionally acquired samples, or dispense with the traditional trigger + timebase sample placing altogether and acquire in a free-run (random) mode. Uniquely the instrument can accept signal modules, clock recovery module, and a Phase Reference module all at the same time, so the clock recovery Clock Out signal can be used by the Phase Reference module, to decrease the jitter of the acquired signal. Superior PerformanceWith its industry-best horizontal timebase stability, signal sensitivity and noise performance, the instrument ensures the most accurately acquired signal. The newest Phase Reference module for the TDS8200 rounds up instrument’s timebase modes for the state-of-the art with jitter performance, available with windowed acquisition and all in all other modes of operation, and for virtually unlimited timebase depth. In every mode the TDS8200’s multi-processor architecture, with dedicated per channel digital signal processors (DSP), guarantees a very high acquisition rate. The TDS8200 True differential TDR capability on as many as 4 differential pairs of signal, each with rise time well below 35 ps (reflected) enable complete TDR/TDT/Crosstalk measurements of complex assemblies. TDR Autoset simplifies the test setup. The TDS8200 implements the popular FrameScan™ acquisition mode, which be used for scanning of the data bits to isolate pattern dependent effects, viewing sub-harmonic interference, or capture the sequence leading to a mask violation. Unexpected features such as averaging of eye diagrams, etc. FrameScan™ also allows the user to view an averaged eye diagrams for applications such as evaluating Inter-Symbol-Interferences or separating pattern related Deterministic jitter from Random Jitter. 8200 Series Sampling Oscilloscope PlatformThe TDS8200 is built on Tektronix’ sampling oscilloscope platform that combines familiar MS Windows® 2000-based PC technologies with world-class waveform acquisition technology. This platform provides a wide array of standard instrumentation and communications interfaces (such as GPIB, Parallel Printer Port, RS-232-C and USB Serial Ports and an Ethernet LAN connection). In addition, the platform includes several mass storage devices (floppy disk, removable hard drive and CD-ROM). Gated triggering, a feature that allows the exclusion of selected time periods from being measured, is offered as an option. Finally, because the system supports an Open Windows environment, new levels of data analysis can be done directly on the instrument using commercially available software packages. Additionally, TekVISA™, a standard software accessory, allows the instrument to be placed under the control of software applications (e.g., LabVIEW, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument, or on external PC workstations network connected to the instrument, without the need for a GPIB hardware interface. Plug and play drivers for LabVIEW and other programs are also supplied. |
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