DPO/DSA/MSO70000C Series

Features & Benefits

• On All Four Channels Simultaneously
  • 20, 16, 12.5, 8, 6, and 4 GHz Bandwidth Models
  • Up to 50 GS/s Real-time Sample Rate
  • Up to 250 Megasample Record Length with MultiView Zoom™ Feature for Quick Navigation
  • Fastest Waveform Capture Rate with >300,000 wfms/s Maximum per Channel
• Uncompromised Bandwidth – Up to 20 GHz on all 4 channels enables measurement on the latest high-speed serial standards
• Superior Signal Integrity and Excellent Signal-to-Noise Ratio – Observe the truest representation of your waveform
• Industry-leading Sample Rate and Timing Resolution
  • 100 GS/s on 2 Channels (20, 16, and 12.5 GHz models)
• 16 Logic Channels with 80 ps Timing Resolution for Debug of Digital and Analog Signals (MSO70000 Series only)
• Pinpoint^® Triggering – Minimize time spent trying to acquire problem signals for efficient troubleshooting and shortened debug time
• 6.25 Gb/s Real-time Serial Trigger – Assures triggering on the first instance of a specified NRZ or 8b/10b pattern to allow isolation of pattern-dependent effects
• Search & Mark – Provides waveform or serial bus pattern matching and software triggers for signals of interest
• Automated Serial Triggering and Decode Options for I²C, SPI, RS-232/422/485/UART, USB 2.0, and MIPI^® D-PHY
• P7500 TriMode™ Probing System – Perfectly matched signal connectivity from 4 GHz to 20 GHz
• Application Support for High-speed Serial Industry Standards, wideband RF, Power Supplies, and Memory – Enables standard-specific certification, measurement automation, and ease of use
• P6780, P6750, and P6717A High-performance 17-channel Logic Probes with Bandwidths up to 2.5 GHz for Connections to Today's Fast Digital Signals (MSO70000 Series only)

Applications

• Design Verification including Signal Integrity, Jitter, and Timing Analysis
• Design Characterization for High-speed, Sophisticated Designs
• Certification Testing of Serial Data Streams for Industry Standards
• Memory Bus Analysis and Debug
• Prototype Turn-on and Power Supply Verification
• Research and Investigation of Transient Phenomena
• Production Testing of Complex Systems
• Spectral Analysis of Transient or Wide-bandwidth RF Signals